Nominations - International Committee

 

David G. Castner, is Director of the National ESCA and Surface Analysis Center for Biomedical Problems (NESAC/BIO) and Professor of Bioengineering and Chemical Engineering at the University of Washington. He is also Associate Dean for Infrastructure in the College of Engineering at the University of Washington. He received a Ph.D. in Physical Chemistry from University of California at Berkeley in 1979. After seven years as a Research Chemist at the Chevron Research Company, he moved to the University of Washington in 1986 and became Director of NESAC/BIO in 1996, He was also the Director of the Center for Nanotechnology at the University of Washington in 2004-2005. He has an active research program in the areas of surface analysis, surface modification, biomaterials and organic thin films, co-authoring more than 200 refereed publications. He is a Fellow of the American Vacuum Society and of Biomaterials Science and Engineering. Prof. Castner received the 2004 Clemson Award for Basic Research from the Society of Biomaterials and the 2003 Excellence in Surface Science Award from the Surfaces in Biomaterials Foundation. He was President of the American Vacuum Society in 2010.

 

David E. Sykes is a director of Loughborough Surface Analysis ltd., a UK based independent company providing surface chemical analysis services to industry and academia; he has been involved with SIMS and surface chemical analysis for over thirty years.
A Fellow of the Institute of Physics, he obtained his BSc in Physics from the University of Warwick in 1970 and MSc (1971) and PhD (1975) from the University of Aston.  Following post doctoral appointments at the Universities of Birmingham and York he moved to the Loughborough University in 1978 where he first became involved with surface chemical analysis.  He left his position of Director of the Institute of Surface Science and Technology at Loughborough University in 1997 to set up LSA ltd.
He is presently: Chairman of the UK Surface Analysis Forum; Chairman of ISO TC201 Sub-Committee 3 on Data Management and Treatment; Recording Secretary to the International Union of Vacuum Science Technique and Application (IUVSTA); member of the BSI CII60 Committee on Surface Chemical Analysis.
A former: Chair and Trustee of the British Vacuum Council; Chair of the Applied Surface Science Division of IUVSTA; UK Councillor to IUVSTA; Chair of the UK SIMS Users Forum; Secretary to the Institute of Physics Thin Films and Surfaces Group; Secretary to the Institute of Physics Surface Science and Technology Division.
He is a member of the steering groups for the ToFSIMS/ISS facility at Imperial College, London and the NEXUS XPS facility at Newcastle University. He sits on the UK National Measurement Systems Working Group on Chemical and Biological Measurement.
David will bring to the committee a depth of experience of practical application of dynamic SIMS, especially in an industrial context, an enthusiasm for measurement, a commitment to standardisation and a broad perspective of surface chemical analysis in general.

 

Peter Sjövall is a Senior Research Scientist at SP Technical Research Institute of Sweden and Adjunct Professor in Biological Physics at Chalmers University of Technology. His current research is focusing on applications of TOF-SIMS in bioscience-related systems, such as cell and tissue samples, artificial membrane systems and biomaterial surfaces. The research is carried out in close collaboration with academic research groups as well as industry, primarily in the bioanalytical, pharmaceutical and medical device areas. He received a Ph.D. in physics at Chalmers University of Technology in 1992 for surface science investigations of elementary surface reactions and after a postdoc period at University of Toronto, where he studied surface photochemical reaction dynamics, he was appointed Assistant Professor at Lund University, where a laboratory for gas-surface dynamics was set up. He has also been Research Scientist and Quality Manager in a Swedish orthopedic company and involved in the generation of several start-up companies. Peter has co-authored >50 peer-reviewed publications. He is a member of the Surface Analysis Working Group (SAWG) within the consultative committee for amount of substance (CCQM) where he is working to help develop the measurement traceability of SIMS to the SI.