Discussion on Complementary Methods and Multi-technique Approaches

 

Although SIMS is a powerful technique that has been enhanced by numerous significant instrumentation advances over the years, just using SIMS by itself to analyze a material rarely provides a complete characterization of that material.  Like all techniques, SIMS has its strengths and weaknesses.  Thus, to obtain a detailed, comprehensive characterization of any material requires the use of a complementary, multi-technique approach.  The selection of particular set of methods and techniques to use for a given analysis will depend on the objectives of that analysis.  This can include techniques that provide higher spatial resolution (e.g., AFM, APT or TEM), better quantitation (e.g., XPS), dynamic and structural information (e.g., NMR, neutron scattering), etc., as well as those can be used in different environments (e.g., liquid vs. UHV). This session will discuss methods that provide complementary information to SIMS and show how that information, when combined with SIMS, can provide a detailed characterization of materials.

The session is organized with introductory and invited talks and a discussion and Q & A section with a panel of the speakers at the end. Colleagues who wish to contribute to the discussion are encouraged to make short presentations to illustrate points that they think will be of general interest (2 minutes maximum and 1 slide only please).


Moderators:

David Castner    University of Washington, Seattle, USA
Chris Grovenor    University of Oxford, UK

Introductory talks:

David Castner    University of Washington, Seattle, USA
Chris Grovenor    University of Oxford, UK
Ian Gilmore    NPL, UK

Invited Speakers:
Thomas F. Kelly    CAMECA, USA
Francois Le Naour    INSERM, France
Morgan Alexander    School of Pharmacy, University of Nottingham, UK

Panel:
Morgan Alexander    School of Pharmacy, University of Nottingham, UK
David Castner    University of Washington, Seattle, USA
Ian Gilmore    NPL, UK
Chris Grovenor    University of Oxford, UK
Thomas F. Kelly    CAMECA, USA
Francois Le Naour    INSERM, France
DaeWon Moon    KRISS, Korea